Related Experiment Video
Updated: Jul 6, 2026

10:28
Compact Lens-less Digital Holographic Microscope for MEMS Inspection and Characterization
Published on: July 5, 2016
Transient deformation measurement with electronic speckle pattern interferometry by use of a holographic optical
B Barrientos García1, A J Moore, C Pérez-López
1Centro de Investigaciones en Optica, Apartado Postal 1-948, Leon, Guanajuato, Mexico.
Applied Optics
|March 8, 2008
Abstract:
We have used a computer-generated holographic optical element (HOE) with electronic speckle pattern interferometry to calculate the interference phase corresponding to the deformation of a test object from a single TV frame. The HOE is a modified crossed phase grating that introduces a known phase change between the +/-1 diffracted orders, without being translated. The progressive propagation of transient mechanical waves was measured with an rms precision of 2pi/30.

