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Measurement of X-ray Beam Coherence along Multiple Directions Using 2-D Checkerboard Phase Grating

Measurement of X-ray Beam Coherence along Multiple Directions Using 2-D Checkerboard Phase Grating

Published on: October 11, 2016

Scanning delay line with a rotating-parallelogram prism for low-coherence interferometry.

L Giniūnas¹, R Danielius, R Karkockas

¹Laser Research Center, Vilnius University, Sauletekio al 10, Vilnius LT-2040, Lithuania. Linas.Giniunas@ff.vu.lt

|March 8, 2008

Summary

A novel optical delay line for low-coherence interferometry offers fast scanning, adjustable range, and high linearity. This technology enables precise, simultaneous distance measurements at multiple depths for advanced applications.

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Area of Science:

Optical Engineering
Metrology
Interferometry

Background:

Low-coherence interferometry (LCI) is a powerful technique for precise distance measurements.
Existing optical delay lines can have limitations in scanning speed, linearity, or adjustability.

Purpose of the Study:

To develop and characterize a fast-scanning optical delay line for LCI.
To achieve good linearity, a high duty cycle, and a continuously adjustable scan range.

Main Methods:

The proposed delay line utilizes a rotating-parallelogram prism with a tilted rotation axis.
Two stationary mirrors are incorporated into the optical path.
The design facilitates nearly simultaneous measurements at two distinct depths.

Main Results:

The developed optical delay line demonstrates fast scanning capabilities.
The system exhibits good linearity and a high duty cycle.
A continuously adjustable scan range is achieved.

Conclusions:

The novel optical delay line is well-suited for LCI applications requiring rapid and precise measurements.
Its design enables efficient absolute and differential distance measurements at multiple depths.