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Updated: Jul 6, 2026

Cooling Rate Dependent Ellipsometry Measurements to Determine the Dynamics of Thin Glassy Films
Published on: January 26, 2016
1Department of Electrical and Electronic Engineering, Imperial College of Science, Technology and Medicine, Exhibition Road, London SW7 2BT United Kingdom. zhussain@dircon.co.uk
Ellipsometry reveals temperature-dependent changes in tungsten oxide (WO(3)) thin films, linking structural shifts to electrochromic properties for technological use. Polaronic excitations explain behavior above room temperature, while polaronic and bipolaronic transitions are key at lower temperatures.
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