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Compact Lens-less Digital Holographic Microscope for MEMS Inspection and Characterization
Published on: July 5, 2016
Optical configuration for TV holography measurement of in-plane and out-of-plane deformations
N K Mohan1, A Andersson, M Sjödahl
1Applied Optics Laboratory, Department of Physics, Indian Institute of Technology, Madras 600 036, India.
Applied Optics
|March 14, 2008
Abstract:
A novel TV holography method is proposed for parallel evaluation of in-plane and out-of-plane deformation fields. The method permits a trade-off between in-plane and out-of-plane measuring sensitivity. A four-exposure, four-frame phase shifting technique is used in the experiments; the experimental results for an aluminum specimen subjected to both rotation in its own plane and a bending couple load at the center are presented.

