Pockels cell voltage probe for noninvasive electron-beam measurements

Accurate measurements of beam position and current are critical for the operation of the high-energy electron accelerators used for radiographic applications. Traditional short-pulse (e.g., 70 ns) machines utilize B-dot loops to monitor these parameters with great success. For long-pulse (e.g., 2 micros) accelerators, beam position and current measurements become more challenging and may require new technology. A novel electro-optic voltage probe has been developed for this application and provides the advantages of complete galvanic isolation, excellent low-frequency performance, and no time integration requirement. The design of a prototype sensor is presented along with preliminary accelerator test data.