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Atomically Defined Templates for Epitaxial Growth of Complex Oxide Thin Films
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Defect formation in hafnium dioxide thin films

D Reicher1, P Black, K Jungling

  • 1Optical Coating and Component Evaluation Laboratory, S. Systems Corporation, PO Box 9316, Albuquerque, New Mexico 87119, USA. reicherd@plk.af.mil

Applied Optics
|March 18, 2008
PubMed

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