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Method for measuring veiling glare in high-performance display devices.

A Badano, M J Flynn

    Applied Optics
    |March 18, 2008
    PubMed
    Summary
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    This study introduces a new method for measuring display veiling glare ratio (G). The technique uses a specialized probe to accurately quantify veiling glare in electronic displays with high precision.

    Area of Science:

    • Optical Engineering
    • Display Technology
    • Metrology

    Background:

    • Veiling glare significantly impacts display image quality by reducing contrast.
    • Accurate measurement of veiling glare is crucial for display performance evaluation.
    • Existing methods may suffer from signal contamination and limited accuracy.

    Purpose of the Study:

    • To develop and validate an experimental method for precise veiling glare ratio (G) measurement in display devices.
    • To minimize signal contamination from surrounding bright fields during measurement.
    • To establish a reliable technique for characterizing display veiling glare.

    Main Methods:

    • Utilized a collimated conic probe to isolate dark spots and minimize surrounding light interference.
    • Introduced a correction factor based on dark-spot radius and probe distance.

    Related Experiment Videos

  • Employed radiographic film test patterns to experimentally determine dark-spot transmission and assess uncertainty.
  • Characterized performance by measuring signal contamination levels.

    • Main Results:

    • Achieved signal contamination less than 10⁻⁴ of the surrounding bright field.
    • Demonstrated measurement of veiling glare ratios (G) in the hundreds with a few percent uncertainty.
    • Reported veiling glare ratios up to approximately 10³ with 10% uncertainty.
    • Successfully measured G for a high-performance monochrome cathode-ray tube display.

    Conclusions:

    • The developed method provides accurate and reliable veiling glare measurements for displays.
    • The technique effectively minimizes signal contamination, enabling precise low-luminance measurements.
    • This method is suitable for characterizing advanced display technologies, including CRT displays.