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Displacement measurement that uses transient photoelectromotive force effects in CdTe:V with frequency-modulated

F Jin1, J B Khurgin, C C Wang

  • 1Department of Electrical and Computer Engineering, The Johns Hopkins University, Baltimore, Maryland 21218, USA. fjin@ece.jhu.edu

Applied Optics
|March 18, 2008
PubMed

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