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Updated: Jul 6, 2026

Measurement of X-ray Beam Coherence along Multiple Directions Using 2-D Checkerboard Phase Grating
Published on: October 11, 2016
1Institute of Modern Optics, Opto-Electronic Information Science and Technology of the Education Ministry of China, Nankai University, Tianjin 300071, China. liuweiyi@public1.tpt.tj.cn
This study introduces a fast, efficient profilometric measurement technique using a color-coded grating. It offers simple hardware and single-exposure 3D data acquisition, ideal for dynamic object inspection.
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