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Spatial versus temporal phase shifting in electronic speckle-pattern interferometry: noise comparison in phase maps
1Fachbereich 8-Physik, Carl von Ossietzky Universität Oldenburg, Postfach 2503, D-26111 Oldenburg, Germany.
Abstract:
Temporal and spatial phase shifting in electronic speckle-pattern interferometry are compared quantitatively with respect to the quality of the resultant deformation phase maps. On the basis of an analysis of the noise in sawtooth fringes a figure of merit is defined and measured for various in-plane and out-of-plane sensitive electronic speckle-pattern interferometry configurations. Varying quantities like the object-illuminating intensity, the beam ratio, the speckle size and shape, and the fringe density allows characteristic behaviors of both phase-shifting methods to be explored.
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