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Updated: Jul 6, 2026

Focussed Ion Beam Milling and Scanning Electron Microscopy of Brain Tissue
08:57

Focussed Ion Beam Milling and Scanning Electron Microscopy of Brain Tissue

Published on: July 6, 2011

Serial section scanning electron microscopy of adult brain tissue using focused ion beam milling

Graham Knott1, Herschel Marchman, David Wall

  • 1Centre Interdisciplinaire de Microscopie Electronique, Ecole Polytechnique Federale de Lausanne, 1015 Lausanne, Switzerland. Graham.Knott@effl.ch

The Journal of Neuroscience : the Official Journal of the Society for Neuroscience
|March 21, 2008
PubMed
Abstract

No abstract available in PubMed .

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