N Alcalá Ochoa1, F Mendoza Santoyo, C Pérez López
1Centro de Investigaciones en Optica, Apartado Postal 1-948, León, Guanajuato, Mexico. alon@foton.cio.mx
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This study introduces a novel multiplication technique for electronic speckle-pattern interferometry (ESPI) fringe analysis. The method enhances fringe visibility and offers an alternative to traditional subtraction and addition methods in ESPI.
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