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Updated: Jul 6, 2026

Carrier Lifetime Measurements in Semiconductors through the Microwave Photoconductivity Decay Method
Published on: April 18, 2019
Quantitative analysis of decay transients applied to a multimode pulsed cavity ringdown experiment
Abstract:
The intensity and noise properties of decay transients obtained in a generic pulsed cavity ringdown experiment are analyzed experimentally and theoretically. A weighted nonlinear least-squares analysis of digitized decay transients is shown that avoids baseline offset effects that induce systematic deviations in the estimation of decay rates. As follows from simulations not only is it a method that provides correct estimates for the values of the fit parameters, but moreover it also yields a correct estimate of the precision of the fit parameters. It is shown experimentally that a properly aligned stable optical resonator can effectively yield monoexponential decays under multimode excitation. An on-line method has been developed, based on a statistical analysis of the noise properties of the decay transients, to align a stable resonator toward this monoexponential decay.
