Search research articles

ABOUT JoVE

Overview Leadership Blog JoVE Help Center

AUTHORS

Publishing Process Editorial Board Scope & Policies Peer Review FAQ Submit

LIBRARIANS

Testimonials Subscriptions Access Resources Library Advisory Board FAQ

RESEARCH

JoVE Journal Methods Collections JoVE Encyclopedia of Experiments Archive

EDUCATION

JoVE Core JoVE Business JoVE Science Education JoVE Lab Manual Faculty Resource Center Faculty Site

Terms & Conditions of Use

Related Concept Videos

Focusing of Light in the Eye

Focusing of Light in the Eye

Light rays enter the eye through the cornea, a transparent dome-shaped tissue that is the eye's outermost layer. The cornea bends or refracts, light rays traveling to the pupil. The shape of the cornea determines how much of the light is bent and whether the image will be focused correctly on the retina at the back of the eye. Once the light has passed through both refraction layers, it converges into a single focal point onto a small area. This is where photoreceptors start transforming...

Phase Contrast and Differential Interference Contrast Microscopy

Phase Contrast and Differential Interference Contrast Microscopy

Phase-Contrast Microscopes
In-phase-contrast microscopes, interference between light directly passing through a cell and light refracted by cellular components is used to create high-contrast, high-resolution images without staining. It is the oldest and simplest type of microscope that creates an image by altering the wavelengths of light rays passing through the specimen. Altered wavelength paths are created using an annular stop in the condenser. The annular stop produces a hollow cone of...

X-ray Crystallography

X-ray Crystallography

The size of the unit cell and the arrangement of atoms in a crystal may be determined from measurements of the diffraction of X-rays by the crystal, termed X-ray crystallography.
Diffraction
Diffraction is the change in the direction of travel experienced by an electromagnetic wave when it encounters a physical barrier whose dimensions are comparable to those of the wavelength of the light. X-rays are electromagnetic radiation with wavelengths about as long as the distance between neighboring...

Atomic Force Microscopy

Atomic Force Microscopy

Atomic force microscopy (AFM) is a type of scanning probe microscopy that can analyze topographic details of various specimens like ceramics, glass, polymers, and biological samples. AFM offers over 1000 times more resolution than the optical imaging system. Images generated from AFM are three-dimensional surface profiles, offering an advantage over the flat, two-dimensional images from other imaging techniques.
The AFM Probe
The probe is regarded as the heart of any AFM setup and comprises the...

You might also read

Related Articles

Articles linked to this work by shared authors, journal, and citation graph.

Sort by

Same author

Note: Fabrication of resolution target for super-resolution microscopy.

The Review of scientific instruments·2015

Same author

Measurement of the charge asymmetry in top quark pair production in <i>pp</i> collisions at [Formula: see text] using the ATLAS detector.

The European physical journal. C, Particles and fields·2015

Same author

Search for lepton flavour violation in the <i>eμ</i> continuum with the ATLAS detector in [Formula: see text]<i>pp</i> collisions at the LHC.

The European physical journal. C, Particles and fields·2015

Same author

Measurement of [Formula: see text] production with a veto on additional central jet activity in <i>pp</i> collisions at [Formula: see text] TeV using the ATLAS detector.

The European physical journal. C, Particles and fields·2015

Same author

Measurement of the top quark mass with the template method in the [Formula: see text] channel using ATLAS data.

The European physical journal. C, Particles and fields·2015

Same author

Search for heavy neutrinos and right-handed <i>W</i> bosons in events with two leptons and jets in <i>pp</i> collisions at [Formula: see text] with the ATLAS detector.

The European physical journal. C, Particles and fields·2015

Search research articles

Related Experiment Video

Updated: Jul 6, 2026

Clarifying and Imaging Candida albicans Biofilms

Clarifying and Imaging Candida albicans Biofilms

Published on: March 6, 2020

Aberration-free imaging with an aplanatic curved diffractive element.

N Bokor, N Davidson

|March 28, 2008

Summary

We developed a new imaging diffractive optical element (DOE) free of coma and aberrations. This aplanatic DOE, recorded on a curved surface, significantly reduces off-axis aberrations compared to flat designs, offering a simpler fabrication process.

Area of Science:

Optics and Photonics
Optical Engineering
Diffractive Optics

Background:

Diffractive optical elements (DOEs) are crucial for optical systems.
First-order aberrations, such as coma, limit the performance of traditional flat DOEs.
Achieving aberration-free performance often requires complex designs and fabrication.

Purpose of the Study:

To demonstrate a novel imaging diffractive optical element (DOE) free of coma and other first-order aberrations.
To investigate the performance benefits of recording DOEs on curved surfaces.
To present a simplified holographic recording method for aberration-corrected DOEs.

Main Methods:

Holographic recording of a DOE on a specifically curved surface.
Satisfying the Abbe sine condition (aplanatic condition) through surface curvature.

More Related Videos

Correction of Presbyopia by Monocular Bi-Aspheric Ablation Profile

Published on: September 20, 2024

Related Experiment Videos

Last Updated: Jul 6, 2026

Clarifying and Imaging Candida albicans Biofilms

Clarifying and Imaging Candida albicans Biofilms

Published on: March 6, 2020

Correction of Presbyopia by Monocular Bi-Aspheric Ablation Profile

Published on: September 20, 2024

Utilizing readily available spherical and plane waves for recording.

Experimental validation and numerical ray-tracing simulations.

Main Results:

The developed DOE is free of coma and other first-order aberrations.
The curved DOE exhibits significantly reduced off-axis aberrations compared to a flat DOE.
Numerical simulations confirm the superior aberration correction of the curved DOE.
The holographic recording process is a single step, enhancing simplicity.

Conclusions:

A curved, aplanatic imaging DOE can be fabricated using a simple, single-step holographic process.
This approach effectively eliminates coma and reduces off-axis aberrations.
The demonstrated DOE offers a promising solution for high-performance imaging systems requiring aberration correction.