Focus Retrocollimated Interferometry for Long-Radius-of-Curvature Measurement

The second moment of area, also known as the moment of inertia of area, is a crucial factor in understanding an object's resistance against bending deformation, or stiffness. To accurately estimate the second moment of area along any axis, one needs to concentrate all areas associated with that object into a thin strip, which should be placed parallel to that particular axis.

Total internal reflection fluorescence microscopy or TIRF is an advanced microscopic technique used to visualize fluorophores in samples close to a solid surface with a higher refractive index, such as a glass coverslip. TIRF only allows fluorophores in proximity to the solid surface to be excited. When light from a medium with a lower refractive index (such as air) hits the glass coverslip at a critical angle, the light undergoes total internal reflection stead of passing through the glass.