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Related Experiment Video

Updated: Jul 6, 2026

$Microfluidic Chips for In Situ Crystal X-ray Diffraction and In Situ Dynamic Light Scattering for Serial Crystallography$

Microfluidic Chips for In Situ Crystal X-ray Diffraction and In Situ Dynamic Light Scattering for Serial Crystallography

Published on: April 24, 2018

Accurate miscut angle determination for spherically bent Bragg crystals.

D S Covita¹, M Ay, S Schlesser

¹Departamento de Física, Universidade de Coimbra, 3004-516 Coimbra, Portugal. daniel.covita@psi.ch

The Review of Scientific Instruments

|April 2, 2008

Summary

This summary is machine-generated.

We present a straightforward method to measure the crystal cut angle and orientation for spherically bent crystals. This technique combines X-ray diffraction and laser alignment for precise analysis in spectroscopy applications.

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Area of Science:

Atomic and Molecular Physics
Materials Science
Spectroscopy

Background:

Spherically bent crystals are crucial for high-resolution spectroscopy, especially in low count-rate experiments like exotic-atom research.
Accurate focal conditions depend on bending radius, Bragg angle, crystal cut angle, and orientation relative to dispersion.

Purpose of the Study:

To develop and present a simple, precise method for measuring the cut angle and orientation of mounted spherically bent crystals.
To facilitate accurate setup and performance of crystal analyzers in spectroscopic applications.

Main Methods:

Combines X-ray diffraction and laser optical alignment.
Utilizes standard X-ray laboratory equipment for ease of implementation.

Main Results:

Successfully demonstrates a method for precise measurement of crystal cut angle and orientation.
Provides a practical approach for characterizing spherically bent crystal analyzers.

Conclusions:

The described method offers a simple yet accurate way to determine critical parameters of spherically bent crystals.
This technique is valuable for optimizing crystal analyzers in demanding spectroscopic research.