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Sub-nanometer Resolution Imaging with Amplitude-modulation Atomic Force Microscopy in Liquid
Published on: December 20, 2016
Toshu An1, Takahiro Nishio, Toyoaki Eguchi
1The Institute for Solid State Physics, The University of Tokyo, 5-1-5 Kashiwa-no-ha, Kashiwa 277-8581, Japan.
This study demonstrates low-temperature ultrahigh vacuum atomic force microscopy (AFM) using a quartz resonator force sensor. This method achieves high-resolution imaging of silicon surfaces at the atomic level.
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