Jove
Visualize
Contact Us
JoVE
x logofacebook logolinkedin logoyoutube logo
ABOUT JoVE
OverviewLeadershipBlogJoVE Help Center
AUTHORS
Publishing ProcessEditorial BoardScope & PoliciesPeer ReviewFAQSubmit
LIBRARIANS
TestimonialsSubscriptionsAccessResourcesLibrary Advisory BoardFAQ
RESEARCH
JoVE JournalMethods CollectionsJoVE Encyclopedia of ExperimentsArchive
EDUCATION
JoVE CoreJoVE BusinessJoVE Science EducationJoVE Lab ManualFaculty Resource CenterFaculty Site
Terms & Conditions of Use
Privacy Policy
Policies

Related Experiment Videos

Robust, common path, phase shifting interferometer and optical profilometer.

Remy Tumbar1, Daniel L Marks, David J Brady

  • 1Department of Molecular Biology and Genetics, Cornell University, Ithaca, New York 14853, USA. rt77@cornell.edu

Applied Optics
|April 3, 2008
PubMed
Summary
This summary is machine-generated.

Related Concept Videos

You might also read

Related Articles

Articles linked to this work by shared authors, journal, and citation graph.

Sort by
Same author

Snapshot 3D and texture imaging with structured illumination.

Optics express·2026
Same author

Dual activation of MC3R and MC4R drives weight loss and reduces food intake in male primates with obesity.

Nature communications·2026
Same author

The melanocortin receptors as targets for general obesity: contextualizing clinical failures and analyzing future perspectives.

Frontiers in endocrinology·2026
Same author

Endogenous targeting lipid nanoparticles for systemic mRNA delivery to lung cancer tumors.

Journal of controlled release : official journal of the Controlled Release Society·2026
Same author

Radiometric sensitivity and resolution of synthetic tracking imaging for orbital debris monitoring.

Optics express·2026
Same author

Sympathetic nerve-fibroblast crosstalk drives nerve injury, fibroblast activation, and matrix remodeling in pancreatic cancer.

JCI insight·2026
Same journal

Multifunctional reconfigurable terahertz metasurface based on vanadium dioxide phase transition: achieving broadband absorption and efficient polarization conversion.

Applied optics·2026
Same journal

High-Q-factor electromagnetically induced transparency utilizing quasi-bound states in the continuum in an all-dielectric terahertz metasurface.

Applied optics·2026
Same journal

Automated stitching interferometry for high-precision metrology of X-ray mirrors.

Applied optics·2026
Same journal

Experimental demonstration of an approach to designing a metal-dielectric DBR resonant cavity structure.

Applied optics·2026
Same journal

High-precision wavefront reconstruction from a single-shot interferogram using a physics-driven hybrid feature calibration network.

Applied optics·2026
Same journal

Ultra-high-Q Fano resonance based on coupled topological corner states in Kagome photonic crystals.

Applied optics·2026
See all related articles

This study presents an improved interferometer for precise surface profiling. The enhanced system offers higher resolution and stability, making it ideal for microscopic imaging and wavefront sensing applications.

Area of Science:

  • Optical Metrology
  • Interferometry
  • Surface Profilometry

Background:

  • Common-path, phase shifting, and shearing interferometers are valuable tools in metrology.
  • Previous implementations had limitations in sampling resolution and light sensitivity.

Purpose of the Study:

  • To describe an improved implementation of a common-path, phase shifting, and shearing interferometer.
  • To demonstrate enhanced performance metrics including sampling resolution and light sensitivity.
  • To showcase the system's applicability in microscopic imaging and wavefront sensing.

Main Methods:

  • Utilized a time-multiplexed phase shifting scheme for enhanced data acquisition.
  • Implemented arbitrary phase shifting algorithms for increased flexibility.

Related Experiment Videos

  • Performed microscopic imaging of a copper-plated silicon wafer surface.

    • Main Results:

    • Achieved higher sampling resolution and improved light sensitivity compared to previous designs.
    • Demonstrated vibration insensitivity with approximately lambda/100 repeatability.
    • Successfully imaged the surface profile of a copper-plated silicon wafer.

    Conclusions:

    • The improved interferometer offers superior performance for precise surface metrology.
    • The system's vibration insensitivity and high repeatability make it suitable for demanding applications.
    • Potential applications include full-field coherent imaging and high dynamic range wavefront sensing.