Two-dimensional dopant profiling with low-energy SEM

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Updated: Jul 6, 2026

All-electronic Nanosecond-resolved Scanning Tunneling Microscopy: Facilitating the Investigation of Single Dopant Charge Dynamics
11:33

All-electronic Nanosecond-resolved Scanning Tunneling Microscopy: Facilitating the Investigation of Single Dopant Charge Dynamics

Published on: January 19, 2018

F Mika1, L Frank

  • 1Institute of Scientific Instruments ASCR, Brno, Czech Republic. fumici@isibrno.cz

Journal of Microscopy
|April 5, 2008
PubMed

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