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Published on: May 3, 2019
Measurement of (241)Am L X-ray emission probabilities
M C Lépy1, J Plagnard, L Ferreux
1Laboratoire National Henri Becquerel, CEA Saclay, F-91191 Gif-sur-Yvette Cedex, France. marie-christine.lepy@cea.fr
Abstract:
Measurements of (241)Am L X-ray emission probabilities were conducted using both HPGe and Si(Li) detectors. The efficiency calibrations of these detectors were performed by means of a tunable, monochromatic photon beam and the determination of the thickness of absorbing materials inside the detector. These efficiency calibrations were obtained without any reference to radionuclide decay data, and with 0.8% relative standard uncertainty. The complex L X-ray region was processed using Voigt functions and by taking account of the detector response function established with the monochromatic beam. Twenty-two components of the L X-ray group were identified and quantified. The present results are compared with previously published data.
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