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Carrier Lifetime Measurements in Semiconductors through the Microwave Photoconductivity Decay Method
07:38

Carrier Lifetime Measurements in Semiconductors through the Microwave Photoconductivity Decay Method

Published on: April 18, 2019

Measurement of carrier mobility in silicon nanowires

Oki Gunawan1, Lidija Sekaric, Amlan Majumdar

  • 1IBM Research Division, TJ Watson Research Center, Yorktown Heights, NY 10598, USA. ogunawa@us.ibm.com

Nano Letters
|May 1, 2008
PubMed

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