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Related Concept Videos

Overview of Electron Microscopy01:25

Overview of Electron Microscopy

The wavelengths of visible light ultimately limit the maximum theoretical resolution of images created by light microscopes. Most light microscopes can only magnify 1000X, and a few can magnify up to 1500X. Electrons, like electromagnetic radiation, can behave like waves, but with wavelengths of 0.005 nm, they produce significantly greater resolution up to 0.05 nm as compared to 500 nm for visible light. An electron microscope (EM) can create a sharp image that is magnified up to 2,000,000X.
Transmission Electron Microscopy01:15

Transmission Electron Microscopy

In 1931, physicist Ernst Ruska—building on the idea that magnetic fields can direct an electron beam just as lenses can direct a beam of light in an optical microscope—developed the first prototype of the electron microscope. This development led to the development of the field of electron microscopy. In the transmission electron microscope (TEM), electrons are produced by a hot tungsten element and accelerated by a potential difference in an electron gun, which gives them up to 400 keV in...
Scanning Electron Microscopy01:07

Scanning Electron Microscopy

A scanning electron microscope (SEM) is used to study the surface features of a sample by using an electron beam that scans the sample surface in a two-dimensional manner. Typically, areas between ~1 centimeter to 5 micrometers in width can be imaged. SEM can be used to image bacteria, viruses, tissues as well as larger samples like insects. Conventional SEM gives a magnification ranging from 20X to 30,000X and spatial resolution of 50 to 100 nanometers.
Fundamental Principles
Accelerated...
Electron Microscope Tomography and Single-particle Reconstruction01:07

Electron Microscope Tomography and Single-particle Reconstruction

Transmission electron microscopy (TEM) can be used to determine the 3D structure of biological samples with the help of techniques such as electron microscope tomography and single-particle reconstruction. While single-particle reconstruction can examine macromolecules and macromolecular complexes in vitro conditions only, tomography permits the study of cell components or small cells in vivo.
Electron Tomography
Electron tomography can be performed either in TEM or STEM (scanning transmission...
Phase Contrast and Differential Interference Contrast Microscopy01:26

Phase Contrast and Differential Interference Contrast Microscopy

Phase-Contrast Microscopes
In-phase-contrast microscopes, interference between light directly passing through a cell and light refracted by cellular components is used to create high-contrast, high-resolution images without staining. It is the oldest and simplest type of microscope that creates an image by altering the wavelengths of light rays passing through the specimen. Altered wavelength paths are created using an annular stop in the condenser. The annular stop produces a hollow cone of...
Cryo-electron Microscopy01:28

Cryo-electron Microscopy

Conventional electron microscopy (EM) involves dehydration, fixation, and staining of biological samples, which distorts the native state of biological molecules and results in several artifacts. Also, the high-energy electron beam damages the sample and makes it difficult to obtain high-resolution images. These issues can be addressed using cryo-EM, which uses frozen samples and gentler electron beams. The technique was developed by Jacques Dubochet, Joachim Frank, and Richard Henderson, for...

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Related Experiment Video

Updated: Jul 5, 2026

Electron Channeling Contrast Imaging for Rapid III-V Heteroepitaxial Characterization
07:50

Electron Channeling Contrast Imaging for Rapid III-V Heteroepitaxial Characterization

Published on: July 17, 2015

A charge coupled device camera with electron decelerator for intermediate voltage electron microscopy.

Kenneth H Downing1, Paul E Mooney

  • 1Life Sciences Division, Lawrence Berkeley National Laboratory, Berkeley, California 94720, USA. khdowning@lbl.gov

The Review of Scientific Instruments
|May 2, 2008
PubMed
Summary
This summary is machine-generated.

Researchers developed a new charge-coupled device (CCD) camera system for intermediate voltage electron microscopes (IVEMs). This system decelerates electrons, significantly improving data quality and resolution for advanced microscopy applications.

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A Machine-Vision Approach to Transmission Electron Microscopy Workflows, Results Analysis and Data Management
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A Machine-Vision Approach to Transmission Electron Microscopy Workflows, Results Analysis and Data Management

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Last Updated: Jul 5, 2026

Electron Channeling Contrast Imaging for Rapid III-V Heteroepitaxial Characterization
07:50

Electron Channeling Contrast Imaging for Rapid III-V Heteroepitaxial Characterization

Published on: July 17, 2015

A Machine-Vision Approach to Transmission Electron Microscopy Workflows, Results Analysis and Data Management
10:23

A Machine-Vision Approach to Transmission Electron Microscopy Workflows, Results Analysis and Data Management

Published on: June 23, 2023

Area of Science:

  • Microscopy
  • Materials Science
  • Biophysics

Background:

  • Intermediate voltage electron microscopes (IVEMs) at 300-400 kV are increasingly used.
  • Charge-coupled device (CCD) cameras offer advantages over film but perform poorly on IVEMs.
  • Conventional 100 kV microscopes show better CCD performance.

Purpose of the Study:

  • To enhance CCD camera performance on IVEMs.
  • To improve data quality and resolution for electron microscopy.
  • To enable advanced applications using direct digital data acquisition.

Main Methods:

  • Developed a CCD camera system with electron deceleration.
  • Decelerated electrons to below 100 kV before impacting the CCD.
  • Compared performance with existing CCDs on IVEMs.

Main Results:

  • Achieved greatly improved signal quality and resolution.
  • Performance significantly better than other CCDs on IVEMs.
  • Enabled high-quality image and diffraction data collection.

Conclusions:

  • The new CCD system overcomes performance degradation on IVEMs.
  • Facilitates high-resolution electron crystallography, single particle analysis, and tomography.
  • Supports the use of larger format CCD chips with smaller pixels for future advancements.