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Three-dimensional particle tracking with subnanometer resolution using off-focus images.

Zhipeng Zhang1, Chia-Hsiang Menq

  • 1Precision Measurement and Control Laboratory, Department of Mechanical Engineering, The Ohio State University, 201 West Nineteenth Avenue, Columbus, Ohio 43210, USA.

Applied Optics
|May 2, 2008
PubMed
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This study introduces a 3D particle tracking algorithm using microscope images, achieving subnanometer resolution at 400 Hz. The method accurately predicts performance using an analytical model derived from calibration data.

Area of Science:

  • Optics and Photonics
  • Biophysics
  • Nanotechnology

Background:

  • Accurate three-dimensional (3D) particle tracking is crucial for various scientific disciplines.
  • Existing methods often face limitations in resolution, speed, or complexity.
  • Developing high-resolution, high-speed tracking techniques remains an active research area.

Purpose of the Study:

  • To present a novel 3D particle tracking algorithm utilizing off-focus microscope images.
  • To achieve subnanometer resolution in all three axes at a high sampling rate.
  • To develop an analytical model for predicting algorithm performance.

Main Methods:

  • Utilizing a complementary metal-oxide-semiconductor (CMOS) camera for high-speed imaging.
  • Employing the centroid method for lateral position estimation.

Related Experiment Videos

  • Estimating axial position by comparing a radius vector derived from off-focus images with a calibrated object-specific model.

    • Main Results:

    • Achieved subnanometer resolution in all three axes at a 400 Hz sampling rate.
    • Developed an analytical model to predict estimation bias and variance.
    • Experimental results confirmed the precision, range, and validity of the theoretical analysis.

    Conclusions:

    • The presented 3D particle tracking algorithm offers high precision and speed.
    • The analytical model enables accurate prediction of measurement performance.
    • This method provides a robust tool for advanced particle tracking applications.