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Scanning hall probe microscopy (SHPM) using quartz crystal AFM feedback.

M Dede¹, K Urkmen, O Girişen

¹Department of Physics, Bilkent University, 06800 Ankara, Turkey.

Journal of Nanoscience and Nanotechnology

|May 10, 2008

Summary

This study presents a simplified Scanning Hall Probe Microscopy (SHPM) method using a quartz crystal tuning fork force sensor. This technique enables high-resolution magnetic imaging of various materials without requiring conductive samples.

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Area of Science:

Materials Science
Physics
Nanotechnology

Background:

Scanning Hall Probe Microscopy (SHPM) offers high-resolution magnetic field imaging.
Conventional SHPM often relies on Scanning Tunneling Microscopy (STM) or Atomic Force Microscopy (AFM) for feedback.
STM-based SHPM necessitates conductive samples, limiting its application.

Purpose of the Study:

To develop a simplified and versatile SHPM technique.
To overcome the limitations of conductive sample requirements in STM-based SHPM.
To enable high-resolution magnetic imaging on a wider range of materials.

Main Methods:

A novel sensor assembly integrating a Hall probe chip with a quartz crystal tuning fork force sensor was fabricated by gluing.
The sensor assembly was dithered at its resonance frequency using a digital Phase Locked Loop circuit for AFM tracking.
SHPM electronics were modified to simultaneously detect AFM topography, frequency shift, and magnetic field images.

Main Results:

The new method successfully imaged magnetic domains and topography of Iron Garnet thin films, NdFeB magnets, and hard disk samples at room temperature.
The performance of this simplified SHPM system was found to be comparable to traditional STM-based SHPM.
The technique eliminates the need for conductive samples or complex microfabrication of integrated cantilever-Hall probes.

Conclusions:

The developed gluing technique offers a practical solution for integrating Hall probes with AFM force sensors.
This simplified SHPM approach expands the applicability of high-resolution magnetic imaging to insulating and non-conductive materials.
The method provides a cost-effective and accessible alternative for magnetic microscopy research.