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Analysis of PVA/AA based photopolymers at the zero spatial frequency limit using interferometric methods
Sergi Gallego1, Andrés Márquez, David Méndez
1Departamento de Física, Ingeniería de Sistemas y Teoría de la Señal, Universidad de Alicante, Alicante, Spain. sergi.gallego@ua.es
Applied Optics
|May 13, 2008
Summary
Photopolymer thickness variations during optical recording were analyzed. A reflection interferometer was used to measure refractive index changes, providing insights into polymer behavior.
Area of Science:
- Materials Science
- Optics
- Polymer Science
Background:
- Photopolymers are used as optical recording media.
- Thickness variations (shrinkage/swelling) occur during photopolymer recording.
- These variations depend on stored spatial frequencies.
Purpose of the Study:
- To analyze thickness variations in polyvinyl alcohol/acrylamide photopolymers.
- To investigate the relationship between spatial frequencies and thickness changes.
- To estimate polymer refractive index using a reflection interferometer.
Main Methods:
- Utilized a reflection interferometer to measure thickness variations.
- Analyzed photopolymer layers based on polyvinyl alcohol/acrylamide.
- Focused on materials previously characterized at low spatial frequencies.
Main Results:
- Thickness variations were successfully measured using the interferometer.
- The technique allowed for the determination of refractive index variations.
- A direct estimation of the polymer's refractive index was achieved.
Conclusions:
- Reflection interferometry is effective for analyzing photopolymer thickness variations.
- Understanding refractive index changes is crucial for optical recording media.
- This study advances the characterization of photopolymer properties for optical applications.
