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Updated: Jul 4, 2026

Photoelectron Imaging of Anions Illustrated by 310 Nm Detachment of F−
Published on: July 27, 2018
P D McCaffrey1, J K Dewhurst, D W H Rankin
1School of Chemistry, The University of Edinburgh, Edinburgh EH9 3JJ, United Kingdom.
This study introduces a new formula for electron scattering cross sections, improving accuracy for molecular structures. The method enhances data fitting and is easily integrated into existing electron diffraction software.
08:44Measurements of Long-range Electronic Correlations During Femtosecond Diffraction Experiments Performed on Nanocrystals of Buckminsterfullerene
Published on: August 22, 2017
08:55Methods of Ex Situ and In Situ Investigations of Structural Transformations: The Case of Crystallization of Metallic Glasses
Published on: June 7, 2018
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