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Related Concept Videos

Transmission Electron Microscopy01:15

Transmission Electron Microscopy

In 1931, physicist Ernst Ruska—building on the idea that magnetic fields can direct an electron beam just as lenses can direct a beam of light in an optical microscope—developed the first prototype of the electron microscope. This development led to the development of the field of electron microscopy. In the transmission electron microscope (TEM), electrons are produced by a hot tungsten element and accelerated by a potential difference in an electron gun, which gives them up to 400 keV in...
Electron Microscope Tomography and Single-particle Reconstruction01:07

Electron Microscope Tomography and Single-particle Reconstruction

Transmission electron microscopy (TEM) can be used to determine the 3D structure of biological samples with the help of techniques such as electron microscope tomography and single-particle reconstruction. While single-particle reconstruction can examine macromolecules and macromolecular complexes in vitro conditions only, tomography permits the study of cell components or small cells in vivo.
Electron Tomography
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Scanning Electron Microscopy01:07

Scanning Electron Microscopy

A scanning electron microscope (SEM) is used to study the surface features of a sample by using an electron beam that scans the sample surface in a two-dimensional manner. Typically, areas between ~1 centimeter to 5 micrometers in width can be imaged. SEM can be used to image bacteria, viruses, tissues as well as larger samples like insects. Conventional SEM gives a magnification ranging from 20X to 30,000X and spatial resolution of 50 to 100 nanometers.
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Overview of Electron Microscopy01:25

Overview of Electron Microscopy

The wavelengths of visible light ultimately limit the maximum theoretical resolution of images created by light microscopes. Most light microscopes can only magnify 1000X, and a few can magnify up to 1500X. Electrons, like electromagnetic radiation, can behave like waves, but with wavelengths of 0.005 nm, they produce significantly greater resolution up to 0.05 nm as compared to 500 nm for visible light. An electron microscope (EM) can create a sharp image that is magnified up to 2,000,000X.
Super-resolution Fluorescence Microscopy01:37

Super-resolution Fluorescence Microscopy

Super-resolution fluorescence microscopy (SRFM) provides a better resolution than conventional fluorescence microscopy by reducing the point spread function (PSF). PSF is the light intensity distribution from a point that causes it to appear blurred. Due to PSF, each fluorescing point appears bigger than its actual size, and it is the PSF interference of nearby fluorophores that causes the blurred image. Various approaches to achieving higher resolution through SRFM have recently been developed.

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Array Tomography Workflow for the Targeted Acquisition of Volume Information using Scanning Electron Microscopy
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An emission-potential multislice approximation to simulate thermal diffuse scattering in high-resolution transmission

Andreas Rosenauer1, Marco Schowalter, John T Titantah

  • 1Institut für Festkörperphysik, Universität Bremen, Otto-Hahn-Allee 1, 28359 Bremen, Germany. rosenauer@ifp.uni-bremen.de

Ultramicroscopy
|June 3, 2008
PubMed
Summary

This study introduces a faster method to simulate thermal diffuse scattering in transmission electron microscopy. The new emission-potential approach closely matches existing methods for analyzing materials like gold and indium antimonide.

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Preparation and Observation of Thick Biological Samples by Scanning Transmission Electron Tomography
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Preparation and Observation of Thick Biological Samples by Scanning Transmission Electron Tomography

Published on: March 12, 2017

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Last Updated: Jul 4, 2026

Array Tomography Workflow for the Targeted Acquisition of Volume Information using Scanning Electron Microscopy
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Preparation and Observation of Thick Biological Samples by Scanning Transmission Electron Tomography
08:04

Preparation and Observation of Thick Biological Samples by Scanning Transmission Electron Tomography

Published on: March 12, 2017

Area of Science:

  • Materials Science
  • Solid-State Physics
  • Electron Microscopy

Background:

  • Thermal diffuse scattering (TDS) significantly impacts high-resolution transmission electron microscopy (HRTEM) images.
  • TDS intensity adds background noise and peaks at atomic column positions, complicating image interpretation.

Purpose of the Study:

  • To develop a computationally efficient approximation for simulating TDS intensity in HRTEM.
  • To validate the proposed method against established techniques for materials like gold (Au) and indium antimonide (InSb).

Main Methods:

  • An emission-potential multislice algorithm was developed for TDS simulation under plane-wave illumination.
  • The method was applied to compute intensity patterns for Au and InSb at various crystal orientations.
  • Results were compared with the frozen lattice and frozen phonon approximations.

Main Results:

  • The emission-potential method provides a computationally less intensive alternative to existing approximations.
  • Simulated intensity patterns showed close agreement with results from the frozen lattice and frozen phonon methods.
  • The frozen phonon method utilized a detailed phonon model derived from density functional theory calculations.

Conclusions:

  • The proposed emission-potential multislice algorithm is a viable and efficient approach for simulating TDS in HRTEM.
  • This method offers a practical tool for analyzing electron microscopy data with reduced computational cost.
  • Accurate simulation of TDS is crucial for interpreting atomic structures in materials science.