X-ray diffuse scattering measurements of nucleation dynamics at femtosecond resolution
A M Lindenberg1, S Engemann, K J Gaffney
1PULSE Center, Stanford Linear Accelerator Center, Menlo Park, California 94025, USA.
Abstract:
Femtosecond time-resolved small and wide angle x-ray diffuse scattering techniques are applied to investigate the ultrafast nucleation processes that occur during the ablation process in semiconducting materials. Following intense optical excitation, a transient liquid state of high compressibility characterized by large-amplitude density fluctuations is observed and the buildup of these fluctuations is measured in real time. Small-angle scattering measurements reveal snapshots of the spontaneous nucleation of nanoscale voids within a metastable liquid and support theoretical predictions of the ablation process.
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