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Updated: Jul 4, 2026

The Frequency Domain Thermoreflectance Technique for Thermal Property Measurements
Published on: December 5, 2025
Exact determination of the phase in time-resolved X-ray reflectometry
Igor Kozhevnikov1, Luca Peverini, Eric Ziegler
1Institute of Crystallography, Leninsky prospect 59, Moscow 119333, Russia.
Abstract:
An exact solution of the phase retrieval problem is described as applied to in-situ X-ray reflectometry of a growing layered film. The following statement is proved: if the reflectivity R and the derivative dR/dt are known at the time t, then the real and the imaginary parts of the amplitude reflectivity r(t) are found uniquely at this point t.
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