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Near-field amplitude and phase recovery using phase-shifting interferometry
B Deutsch1, R Hillenbrand, L Novotny
1The Institute of Optics, University of Rochester, Rochester, NY 14611, USA.
Optics Express
|June 11, 2008
Summary
Phase-shifting interferometry enables nanoscale measurement of optical field amplitude and phase on sample surfaces using scattering-type scanning near-field optical microscopy. This simpler, more robust method advances light-matter interaction studies.
Area of Science:
- Optics and Photonics
- Materials Science
- Nanotechnology
Background:
- Scattering-type scanning near-field optical microscopy (s-SNOM) offers high spatial resolution for light-matter interaction studies.
- Near-field scattering of light by a metallic probe reveals sample optical properties through amplitude and phase changes.
Purpose of the Study:
- To implement and validate a phase-shifting interferometry technique for extracting amplitude and phase information in s-SNOM.
- To demonstrate nanoscale measurement of optical field distributions on sample surfaces.
Main Methods:
- Utilized phase-shifting interferometry within an interferometric near-field scattering system.
- Scattered light from a metallic probe was analyzed for amplitude and phase changes.
- Recorded optical images were compared with theoretical predictions.
Main Results:
- Successfully measured amplitude and phase distributions of optical fields with nanoscale resolution.
- Demonstrated the capability to map optical properties on sample surfaces.
- Validated the accuracy of the implemented method against theoretical models.
Conclusions:
- The developed phase-shifting method provides a simpler and less error-prone alternative to heterodyne and homodyne techniques for s-SNOM.
- This technique enhances the ability to study light-matter interactions at the nanoscale.
- Enables precise measurement of optical field characteristics on various sample types.
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