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Cooling Rate Dependent Ellipsometry Measurements to Determine the Dynamics of Thin Glassy Films
09:32

Cooling Rate Dependent Ellipsometry Measurements to Determine the Dynamics of Thin Glassy Films

Published on: January 26, 2016

Dielectric functions of a growing silver film determined using dynamic in situ spectroscopic ellipsometry

T W H Oates1, L Ryves, M M M Bilek

  • 1Applied and Plasma Physics, School of Physics, University of Sydney, Sydney, Australia. oates@physics.usyd.edu.au

Optics Express
|June 11, 2008
PubMed

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