Thickness dependent CARS measurement of polymeric thin films without depth-profiling

Dae Sik Choi1, Sae Chae Jeoung, Byung-Hyuk Chon

  • 1Division of Advanced Technology, Korea Research Institute of Standards and Science, Daejeon 305-340, Korea.

Optics Express
|June 11, 2008
PubMed

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