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Related Concept Videos

Total Internal Reflection Fluorescence Microscopy01:05

Total Internal Reflection Fluorescence Microscopy

Total internal reflection fluorescence microscopy or TIRF is an advanced microscopic technique used to visualize fluorophores in samples close to a solid surface with a higher refractive index, such as a glass coverslip. TIRF only allows fluorophores in proximity to the solid surface to be excited. When light from a medium with a lower refractive index (such as air) hits the glass coverslip at a critical angle, the light undergoes total internal reflection stead of passing through the glass.

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Terahertz Imaging and Characterization Protocol for Freshly Excised Breast Cancer Tumors
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Spectroscopic THz near-field microscope.

H-G von Ribbeck1, M Brehm, D W van der Weide

  • 1Max-Planck-Institut für Biochemie and Center for Nanoscience, 82152 Martinsried (München), Germany. ribbeck@biochem.mpg.de

Optics Express
|June 11, 2008
PubMed
Summary
This summary is machine-generated.

We developed a scattering-type scanning near-field optical microscope (s-SNOM) using broadband terahertz (THz) illumination. This technique allows for detailed analysis of material properties through near-field scattering spectra, particularly for silicon samples.

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Area of Science:

  • Optics and Photonics
  • Materials Science
  • Nanotechnology

Background:

  • Scanning near-field optical microscopy (SNOM) offers nanoscale optical characterization.
  • Terahertz (THz) spectroscopy provides unique insights into material properties.

Purpose of the Study:

  • To demonstrate a scattering-type scanning near-field optical microscope (s-SNOM) system utilizing broadband THz illumination.
  • To analyze near-field scattering spectra for material characterization.

Main Methods:

  • Utilized a cantilevered tungsten (W) tip in tapping atomic force microscopy (AFM) mode.
  • Employed asynchronous optical sampling (ASOPS) for direct scattering spectrum optimization.
  • Implemented a space-domain delay stage and harmonic demodulation for near-field scattering detection.
  • Determined true near-field interaction via tip-sample approach behavior on gold (Au) surfaces.

Main Results:

  • Successfully obtained and optimized direct scattering spectra using ASOPS.
  • Observed near-field scattering signals through advanced detection techniques.
  • Validated near-field interaction by analyzing tip approach curves on Au.
  • Presented scattering spectra from silicon (Si) samples with varying doping levels.

Conclusions:

  • The developed THz s-SNOM system enables high-resolution optical characterization at the nanoscale.
  • The technique is capable of distinguishing between materials with different electronic properties, as demonstrated with doped Si.
  • This approach opens avenues for advanced nanoscale material analysis in the THz frequency range.