Related Experiment Video

Updated: Jul 4, 2026

Carrier Lifetime Measurements in Semiconductors through the Microwave Photoconductivity Decay Method
07:38

Carrier Lifetime Measurements in Semiconductors through the Microwave Photoconductivity Decay Method

Published on: April 18, 2019

Demonstration of carrier envelope offset locking with low pulse energy

Atsushi Ishizawa1, Tadashi Nishikawa, Shinichi Aozasa

  • 1NTT Basic Research Laboratories, NTT Corporation, 3-1 Morinosato Wakamiya, Atsugi, Kanagawa 243-0198, Japan. ishizawa@will.brl.ntt.co.jp

Optics Express
|June 11, 2008
PubMed

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