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Updated: Jul 4, 2026

Characterization of SiN Integrated Optical Phased Arrays on a Wafer-Scale Test Station
Published on: April 1, 2020
Near-field imaging of Bloch surface waves on silicon nitride one-dimensional photonic crystals
Emiliano Descrovi1, Tristan Sfez, Lorenzo Dominici
1Dipartimento di Fisica, Politecnico di Torino, corso Duca degli Abruzzi 24, 10129 Torino, Italy. emiliano.descrovi@polito.it
Abstract:
We perform a near-field mapping of Bloch Surface Waves excited at the truncation interface of a planar silicon nitride multilayer. We directly determine the field distribution of Bloch Surface Waves along the propagation direction and normally to the surface. Furthermore, we present a direct measurement of a near-field enhancement effect under particular coupling conditions. Experimental evidence demonstrates that a approximately 10(2) near-field intensity enhancement can be realistically attained, thus confirming predictions from rigorous calculations.

