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Obstacle detection and spectral discrimination using multi-wavelength motionless wide angle laser scanning
Kaveh Sahba1, Kamal E Alameh, Clifton L Smith
1WA Centre of Excellence for MicroPhotonic Systems, Electronic Science Research Institute, Edith Cowan University, 100 Joondalup Drive, Joondalup 6027, Western Australia. k.sahba@ecu.edu.au
Optics Express
|June 11, 2008
Summary
This study demonstrates a novel wide-angle laser scanning system using a unique waveguide for 3D measurements and material identification. The system achieves over 93% accuracy for distances up to 5 meters indoors.
Area of Science:
- Optics and Photonics
- 3D Sensing Technologies
- Spectroscopy
Background:
- Traditional laser scanning systems often have limitations in angular coverage and simultaneous multi-wavelength analysis.
- Accurate 3D coordinate acquisition and material identification are crucial for various applications, including robotics and remote sensing.
Purpose of the Study:
- To develop and demonstrate a static laser scanning system capable of wide-angle coverage using a novel cylindrical quasi-cavity waveguide.
- To integrate discrete laser spectroscopy for enhanced object characterization, including 3D positioning and surface material identification.
Main Methods:
- Utilized laser triangulation with 20 laser beams from a cylindrical quasi-cavity waveguide for 3D ranging.
- Employed a system of linear equations and principal ray plotting to calculate distances and angles.
- Integrated 640nm and 785nm laser diodes for discrete laser spectroscopy, with reflected light captured by a CCD imager.
- Calibrated the system using constrained non-linear optimization for instrumental parameters.
Main Results:
- Achieved distance accuracies exceeding 93% for measurements over 5 meters indoors.
- Demonstrated simultaneous spectral measurements from the same point using both red and infrared laser diodes.
- Successfully discriminated between natural objects based on differences in reflected light intensity.
Conclusions:
- The developed system offers a robust solution for wide-angle 3D scanning and material identification.
- The integration of multi-wavelength spectroscopy enhances object characterization, providing both 3D coordinates and surface material insights.
- This technology has potential applications in fields requiring detailed object analysis from a single measurement point.
