High-contrast single-particle tracking by selective focal plane illumination microscopy

Jörg G Ritter1, Roman Veith, Jan-Peter Siebrasse

  • 1Institute of Physical and Theoretical Chemistry, Rheinische-Friedrich-Wilhelms Universität Bonn,Wegelerstrasse 12, D-53115 Bonn, Germany.

Optics Express
|June 12, 2008
PubMed
Summary

Selective plane illumination microscopy (SPIM) overcomes out-of-focus fluorescence in biological imaging. This high-resolution technique enables clear visualization and tracking of dynamic processes in extended 3D systems.

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