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Updated: Jul 4, 2026

Simulation, Fabrication and Characterization of THz Metamaterial Absorbers
Published on: December 27, 2012
Negative index short-slab pair and continuous wires metamaterials in the far infrared regime
T F Gundogdu1, N Katsarakis, M Kafesaki
1Institute of Electronic Structure and Laser (IESL), Foundation for Research and Technology-Hellas, P .O. Box 1527, 71110 Heraklion, Crete, Greece. tamara@iesl.forth.gr
Abstract:
Using transmission and reflection measurements under normal incidence in one and three layers of a mum-scale metamaterial consisting of pairs of short-slabs and continuous wires, fabricated by a photolithography procedure, we demonstrate the occurrence of a negative refractive index regime in the far infrared range, ~2.4-3 THz. The negative index behavior in that system at ~2.4-3 THz is further confirmed by associated simulations, which are in qualitative agreement with the experimental results.

