An analytical model for light ion pencil beam dose distributions: multiple scattering of primary and secondary ions

An analytical algorithm based on the generalized Fermi-Eyges theory, amended for multiple Coulomb scattering and energy loss straggling, is used for calculation of the dose distribution of light ion beams in water. Pencil beam energy deposition distributions are derived for light ions by weighting a Monte Carlo (MC) calculated planar integral dose distribution with analytically calculated multiple scattering and range straggling distributions. The planar integral dose distributions are calculated using the MC code SHIELD-HIT07, in which multiple scattering and energy loss straggling processes are excluded. The contribution from nuclear reactions is included in the MC calculations. Multiple scattering processes are calculated separately for primary and secondary ions and parameters of the initial angular and radial spreads, and the covariance of these are derived by a least-square parameterization of the SHIELD-HIT07 data. The results from this analytical algorithm are compared to pencil beam dose distributions obtained from SHIELD-HIT07, where all processes are included, as well as to experimental data. The presented analytical approach allows for the accurate calculation of the spatial energy deposition distributions of ions of atomic numbers Z = 1 - 8.