Related Experiment Video
Updated: Jul 4, 2026
08:20
Sample Preparation by 3D-Correlative Focused Ion Beam Milling for High-Resolution Cryo-Electron Tomography
Published on: October 25, 2021
In situ lift-out: steps to improve yield and a comparison with other FIB TEM sample preparation techniques
1Materials Science Centre, University of Manchester, Manchester M1 7HS, UK. richard.langford@manchester.ac.uk
Micron (Oxford, England : 1993)
|June 17, 2008
Abstract:
Steps to improve the success yield of the in situ lift-out technique are presented. These include tapping the plinth of the system and monitoring the grounding current to check the lift-out needle is fixed to the material being removed. In addition, the relative success yields and the time to prepare a TEM lamella for the three main FIB methods are discussed and compared.
