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Determination of the Excitation and Coupling Rates Between Light Emitters and Surface Plasmon Polaritons
Published on: July 21, 2018
Complex propagation constants of surface plasmon polariton rectangular waveguide by method of lines
Tran T Minh1, Kazuo Tanaka, Masahiro Tanaka
1Department of Electronics and Computer Engineering, Gifu University, Yanagido 1-1, Gifu City, Japan. ttminh@tnk.info.gifu-u.ac.jp
Optics Express
|June 26, 2008
Summary
This study introduces new cut-off conditions for surface plasmon polariton (SPP) rectangular hollow waveguides. Numerical simulations reveal unique propagation characteristics and compare different metals using the method of lines.
Area of Science:
- Physics
- Materials Science
- Nanophotonics
Background:
- Surface plasmon polaritons (SPPs) enable light confinement below the diffraction limit.
- Rectangular hollow waveguides offer unique optical properties for SPP propagation.
- Accurate modeling of SPP waveguides is crucial for device design.
Purpose of the Study:
- To numerically investigate the complex propagation constants of SPP rectangular hollow waveguides.
- To propose novel cut-off conditions for these waveguides.
- To analyze the influence of waveguide dimensions and wavelength on SPP propagation.
Main Methods:
- Utilizing the Method of Lines (MoL) for numerical analysis.
- Examining the Effective Index Method (EIM) for validity and limitations.
- Comparing numerical results from MoL with approximate results from EIM.
Main Results:
- New cut-off conditions for SPP waveguides were established.
- Complex propagation constants were analyzed concerning waveguide dimensions and wavelength.
- Fundamental and unusual characteristics of SPP waveguides were identified.
- The validity and limitations of the EIM were assessed.
Conclusions:
- The MoL provides accurate results for SPP waveguide analysis.
- EIM offers approximations but has limitations compared to MoL.
- Propagation characteristics vary significantly across different metals.
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