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Optimized free-form phase mask for extension of depth of field in wavefront-coded imaging
Yasuhisa Takahashi1, Shinichi Komatsu
1Department of Applied Physics, Waseda University, 3-4-1 Okubo, Shinjuku, Tokyo, 169-8555, Japan.
Optics Letters
|July 3, 2008
Abstract:
To achieve a further extension of the depth of field in wavefront-coded imaging by reducing the impact of focus error in the optical transfer function, we propose the use of a free-form phase mask (FPM) instead of a conventional cubic phase mask (CPM). We optimized the shape of the FPM using the simulated annealing algorithm and confirmed that the optimized FPM provides a much larger focal tolerance and better final images than the CPM in the noise-free case.
