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Compact two-dimensional coarse-positioner for scanning probe microscopes.

Anjan K Gupta¹, Rajiv Shankar Sinha, Reetesh Kumar Singh

¹Department of Physics, Indian Institute of Technology Kanpur, Kanpur, India.

The Review of Scientific Instruments

|July 8, 2008

Summary

We developed a compact xy-positioner for scanning probe microscopes using piezoelectric bimorphs. This device enables precise movement for advanced microscopy applications.

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Area of Science:

Microscopy
Materials Science
Nanotechnology

Background:

Scanning probe microscopy (SPM) requires precise positioning stages for high-resolution imaging.
Existing SPM positioners can be bulky or lack the necessary precision for certain applications.

Purpose of the Study:

To design and fabricate a compact, high-precision two-dimensional (xy) positioner for scanning probe microscopes.
To utilize piezoelectric bimorphs for controlled motion in a novel configuration.

Main Methods:

The positioner employs three piezoelectric bimorphs actuated by electrical voltage.
These bimorphs are configured to deform in flexing or length-change modes.
A movable platform with sapphire disks slides against fixed plates, enabling xy-plane translation.

Main Results:

The fabricated positioner is compact and integrates piezoelectric bimorphs effectively.
Sequential deformation of bimorphs allows for controlled, stepwise movement of the platform.
Initial tests with an optical microscope and a scanning tunneling microscope demonstrated the positioner's functionality.

Conclusions:

A novel compact xy-positioner for SPM has been successfully designed, fabricated, and tested.
The use of piezoelectric bimorphs offers a viable mechanism for precise nanoscale positioning.
This development contributes to advancements in compact and precise instrumentation for microscopy.