Compact two-dimensional coarse-positioner for scanning probe microscopes

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Active Probe Atomic Force Microscopy with Quattro-Parallel Cantilever Arrays for High-Throughput Large-Scale Sample Inspection
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Active Probe Atomic Force Microscopy with Quattro-Parallel Cantilever Arrays for High-Throughput Large-Scale Sample Inspection

Published on: June 13, 2023

Anjan K Gupta1, Rajiv Shankar Sinha, Reetesh Kumar Singh

  • 1Department of Physics, Indian Institute of Technology Kanpur, Kanpur, India.

The Review of Scientific Instruments
|July 8, 2008
PubMed

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