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Inductively Coupled Plasma Atomic Emission Spectroscopy: Instrumentation

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Inductively coupled plasma (ICP) is the common plasma source used in atomic emission spectroscopy (AES), a technique that detects and analyzes various elements in a sample. This method is often called inductively coupled plasma atomic emission spectroscopy (ICP-AES).
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Rapid Scan Electron Paramagnetic Resonance Opens New Avenues for Imaging Physiologically Important Parameters In Vivo

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Near-simultaneous dual energy range EELS spectrum imaging.

J Scott¹, P J Thomas, M Mackenzie

¹Department of Physics and Astronomy, University of Glasgow, Glasgow G12 8QQ, Scotland, UK.

Ultramicroscopy

|July 8, 2008

Summary

This study introduces a novel system for collecting electron energy loss spectroscopy (EELS) data, enabling simultaneous acquisition of core and low-loss spectra for detailed material analysis.

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Area of Science:

Materials Science
Spectroscopy
Electron Microscopy

Background:

Traditional electron energy loss spectroscopy (EELS) methods often face limitations in simultaneously capturing both low-loss and core-loss spectral regions with high fidelity.
Acquiring comprehensive spectral data across different energy ranges at each pixel is crucial for advanced materials characterization.

Purpose of the Study:

To describe a new system designed for the simultaneous collection of low-loss and core-loss spectra in spectrum imaging.
To enable high-quality EELS data acquisition across diverse energy regions for comprehensive material analysis.

Main Methods:

Utilizes a fast electrostatic shutter controlled by spectrum imaging software.
Employs CCD camera controller for synchronization, allowing simultaneous X-ray spectrum and imaging detector signal collection.
Integrates existing spectrum imaging software features, including drift correction and sub-pixel scanning.

Main Results:

Achieves high-quality spectra acquisition from both core and low-loss regions at each pixel.
Facilitates full processing of EELS data, enabling advanced applications.
Demonstrates benefits such as deconvolution, absolute thickness mapping, and atomic density determination.

Conclusions:

The developed system significantly enhances EELS data acquisition capabilities.
It supports detailed quantitative analysis, including elemental mapping and thickness determination.
The system offers potential for further advancements in electron spectroscopy and microscopy.