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A Machine-Vision Approach to Transmission Electron Microscopy Workflows, Results Analysis and Data Management
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A Machine-Vision Approach to Transmission Electron Microscopy Workflows, Results Analysis and Data Management

Published on: June 23, 2023

Retrieval of absorptive potential variation in electron beam sensitive specimens using a single energy-filtered

Somnath Bhattacharyya1, Joerg R Jinschek

  • 1Institut für Oberflächenmodifizierung eV, 04328 Leipzig, Germany. somnath_tem@yahoo.com

Microscopy Research and Technique
|July 10, 2008
PubMed

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