Surface charge microscopy: novel technique for mapping charge-mosaic surfaces in electrolyte solutions

Xihui Yin1, Jaroslaw Drelich

  • 1Department of Materials Science and Engineering, Michigan Technological University, Houghton, Michigan 49931, USA.

Summary

This study introduces atomic force microscopy (AFM) to map surface potential heterogeneities on multiphase volcanic rock. This technique overcomes limitations of traditional electrokinetic methods, providing spatially resolved charge density data.

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