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Simulation of the Planetary Interior Differentiation Processes in the Laboratory
Published on: November 15, 2013
Sample cell for EXAFS measurements on molten materials at elevated temperatures
J C Mikkelsen1, J B Boyce, R Allen
1Xerox Palo Alto Research Center, Palo Alto, California 94304, USA.
The Review of Scientific Instruments
|March 1, 1980
Abstract:
We describe the design, fabrication, and utilization of a simple sample cell for extended x-ray absorption fine structure (EXAFS) measurements at elevated temperature. The cell is rigid, inert, easy to fabricate, cheap and effective in maintaining the critical specimen dimensions of both solid and liquid samples up to 1000 degrees C.

