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Some modifications of electric circuitry for internal friction measurements of U-shape specimens
O Yoshinari1, M Koiwa, H Sugawara
1Graduate School, Tohoku University, Sendai 980, Japan.
The Review of Scientific Instruments
|March 1, 1980
Abstract:
Some modifications of the electric circuitry are described for the apparatus of the internal friction measurement of thin wire specimens; the apparatus has been developed by Franklin et al. The improved apparatus has been successfully used in the internal friction measurements of cold-worked vanadium specimens.
