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Theoretical Calculation and Experimental Verification for Dislocation Reduction in Germanium Epitaxial Layers with Semicylindrical Voids on Silicon
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High performance germanium photodetectors integrated on submicron silicon waveguides by low temperature wafer bonding

Long Chen1, Po Dong, Michal Lipson

  • 1School of Electrical and Computer Engineering, Cornell University, Ithaca, NY 14853, USA. lc286@cornell.edu

Optics Express
|July 24, 2008
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