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In Situ SIMS and IR Spectroscopy of Well-defined Surfaces Prepared by Soft Landing of Mass-selected Ions
Published on: June 16, 2014
Sibylle Gemming1, Gotthard Seifert
1Institute of Ion Beam Physics and Materials Research, Forschungszentrum Dresden-Rossendorf, PO Box 510119, 01314 Dresden, Germany. s.gemming@fzd.de
No abstract available in PubMed .